Thermal Coupling

The performance of high-tech circuitry such as processors and power devices also largely depends on the thermal level. Semiconductor devices loss their ability of fast switching if the temperature increases to much. Furthermore after a critical temperature is reached the device will be destroyed. Therefore monitoring temperature and regulating cooling are important issues.
In our research, we set up simulation models for semiconductor equations and integrated circuits, which incorporate transient temperature changes in the device and heat conduction between devices. That is an electric network as well as semiconductor equations have to be equipped with an appropriate model for power transfer and heat conduction.
Since this multiphysical problem of coupled electric networks and heat conduction exhibits widely separated time scales, not only the model but also the numerical algorithms need be design to enable fast simulations. Multirate cosimulation is an good choice if the coupling is appropriately set up. Please see also: (Coupled DAEs).
Publications
- 2016
3495.
Setzer, Klaus-Dieter; Fink, Ewald H.; Alekseyev, Aleksey B.; Liebermann, Heinz-Peter; Buenker, Robert J.
Experimental and theoretical study of the electronic states and spectra of NaAs
Journal of Molecular Spectroscopy, 320 :39-47
2016
Herausgeber: Academic Press3494.
Setzer, Klaus-Dieter; Fink, Ewald H.; Alekseyev, Aleksey B.; Liebermann, Heinz-Peter; Buenker, Robert J.
Experimental and theoretical study of the electronic states and spectra of NaAs
Journal of Molecular Spectroscopy, 320 :39-47
2016
Herausgeber: Academic Press3493.
Setzer, Klaus-Dieter; Fink, Ewald H.; Alekseyev, Aleksey B.; Liebermann, Heinz-Peter; Buenker, Robert J.
Experimental and theoretical study of the electronic states and spectra of NaAs
Journal of Molecular Spectroscopy, 320 :39-47
2016
Herausgeber: Academic Press3492.
Tasic, B.; Dohmen, J. J.; Maten, E. J. W.; Beelen, T. G. J.; Janssen, H. H. J. M.; Schilders, W. H. A.; Günther, M.
Fast fault simulation to identify subcircuits involving faulty components
In Russo, Giovanni and Capasso, Vincenzo and Nicosia, Giuseppe and Romano, Vittorio, Editor, Progress in Industrial Mathematics at ECMI 2014ausMathematics in Industry, Seite 369–376
In Russo, Giovanni and Capasso, Vincenzo and Nicosia, Giuseppe and Romano, Vittorio, Editor
Herausgeber: Springer Cham
20163491.
Tasic, B.; Dohmen, J. J.; Maten, E. J. W.; Beelen, T. G. J.; Janssen, H. H. J. M.; Schilders, W. H. A.; Günther, M.
Fast fault simulation to identify subcircuits involving faulty components
In Russo, Giovanni and Capasso, Vincenzo and Nicosia, Giuseppe and Romano, Vittorio, Editor, Progress in Industrial Mathematics at ECMI 2014ausMathematics in Industry, Seite 369–376
In Russo, Giovanni and Capasso, Vincenzo and Nicosia, Giuseppe and Romano, Vittorio, Editor
Herausgeber: Springer Cham
20163490.
Tasi{\'c}, B; Dohmen, JJ; Beelen, TGJ; Janssen, HHJM; Schilders, WHA
Fast Fault Simulation to identify subcircuits involving faulty components
In G. Russo and V. Capasso and G. Nicosia and V. Romano, Editor, Progress in Industrial Mathematics at ECMI 2014 18Band22ausMathematics in Industry, Seite 369--376
Springer International Publishing
In G. Russo and V. Capasso and G. Nicosia and V. Romano, Editor
Herausgeber: Springer International Publishing
20163489.
Tasic, Bratislav; Dohmen, Jos J.; Janssen, Rick; Maten, E. Jan W.; Beelen, Theo G.J.; Pulch, Roland
Fast time-domain simulation for reliable fault detection
2016 Design, Automation & Test in Europe Conference & Exhibition (DATE), Seite 301–306
Herausgeber: IEEE
20163488.
Tasi{\'{c}}, Bratislav; Dohmen, Jos J.; Janssen, Rick; Maten, E. Jan W.; Pulch, Roland; Beelen, Theo G. J.
Fast Time-Domain Simulation for Reliable Fault Detection
Proceedings of the 2016 Design, Automation {\&} Test in Europe Conference {\&} Exhibition ({DATE}), Seite 301-306
Herausgeber: Research Publishing Services
20163487.
Ehrhardt, Matthias; Günther, Michael
Fichera theory and its application in finance
Progress in Industrial Mathematics at ECMI 2014 18, Seite 103--111
Springer International Publishing
Herausgeber: Springer, Berlin, Heidelberg
20163486.
Ehrhardt, Matthias; Günther, Michael
Fichera theory and its application in finance
Progress in Industrial Mathematics at ECMI 2014ausMathematics in Industry, Seite 103–111
Herausgeber: Springer Cham
20163485.
Ehrhardt, Matthias; Günther, Michael
Fichera theory and its application in finance
Progress in Industrial Mathematics at ECMI 2014ausMathematics in Industry, Seite 103–111
Herausgeber: Springer Cham
20163484.
Ehrhardt, Matthias; Günther, Michael
Fichera theory and its application in finance
Progress in Industrial Mathematics at ECMI 2014ausMathematics in Industry, Seite 103–111
Herausgeber: Springer Cham
20163483.
Gausling, K.; Bartel, A.
First Results for Uncertainty Quantification in Co-Simulation of Coupled Electric Circuits
, Scientific Computing in Electrical EngineeringBand23ausMathematics in Industry, Seite 243--251
Herausgeber: Springer
20163482.
Gausling, Kai; Bartel, Andreas
First results for uncertainty quantification in co-simulation of coupled electrical circuits
In Bartel, Andreas and Clemens, Markus and Günther, Michael and ter Maten, E. Jan W., Editor, Scientific Computing in Electrical Engineering: SCEE 2014, Wuppertal, Germany, July 2014ausMathematics in Industry, Seite 243–251
In Bartel, Andreas and Clemens, Markus and Günther, Michael and ter Maten, E. Jan W., Editor
Herausgeber: Springer Cham
20163481.
Gausling, Kai; Bartel, Andreas
First results for uncertainty quantification in co-simulation of coupled electrical circuits
Scientific Computing in Electrical Engineering: SCEE 2014, Wuppertal, Germany, July 2014, Seite 243--251
Springer International Publishing
20163480.
Gausling, Kai; Bartel, Andreas
First results for uncertainty quantification in co-simulation of coupled electrical circuits
In Bartel, Andreas and Clemens, Markus and Günther, Michael and ter Maten, E. Jan W., Editor, Scientific Computing in Electrical Engineering: SCEE 2014, Wuppertal, Germany, July 2014ausMathematics in Industry, Seite 243–251
In Bartel, Andreas and Clemens, Markus and Günther, Michael and ter Maten, E. Jan W., Editor
Herausgeber: Springer Cham
20163479.
Bohrmann-Linde, Claudia
Funktionale Sprachwechsel und Wechsel der Darstellungsformen im bilingualen Chemieunterricht
Bilingualen Unterricht weiterentwickeln und erforschen
Seite 165-181
Herausgeber: Peter Lang Edition, Frankfurt am Main
2016
165-181ISBN: 978-3-631-67896-1
3478.
[german] Tausch, Michael W.; Meuter, Nico
Funktionelle Farbstoffe - Interaktionsbox für Schulen und Universitäten
Praxis der Naturwissenschaften - Chemie in der Schule, 65 (1) :5
20163477.
Tausch, Michael W.
Funktionelle Farbstoffe für nachhaltiges Lernen
Praxis der Naturwissenschaften - Chemie in der Schule, 65 (1) :4
20163476.
Baumann, Katharina; Heilmann, Margareta; Raşa, Ioan
Further results for k-th order Kantorovich modification of linking Baskakov type operators
Results in Mathematics, 69 (3) :297-315
2016
ISSN: 1420-90123475.
Wissdorf, Walter; M{ü}ller, David; Brachth{ä}user, Yessica; Langner, Markus; Derpmann, Valerie; Klopotowski, Sebastian; Polaczek, Christine; Kersten, Hendrik; Brockmann, Klaus Josef; Benter, Thorsten
Gas Flow Dynamics in Inlet Capillaries: Evidence for non Laminar Conditions
Journal of The American Society for Mass Spectrometry, 27 (9) :1550-1563
2016
Herausgeber: Journal of The American Society for Mass Spectrometry3474.
Wissdorf, Walter; M{ü}ller, David; Brachth{ä}user, Yessica; Langner, Markus; Derpmann, Valerie; Klopotowski, Sebastian; Polaczek, Christine; Kersten, Hendrik; Brockmann, Klaus Josef; Benter, Thorsten
Gas Flow Dynamics in Inlet Capillaries: Evidence for non Laminar Conditions
Journal of The American Society for Mass Spectrometry, 27 (9) :1550-1563
2016
Herausgeber: Journal of The American Society for Mass Spectrometry3473.
Wißdorf, Walter; Müller, David; Brachthäuser, Yessica; Langner, Markus; Derpmann, Valerie; Klopotowski, Sebastian; Polaczek, Christine; Kersten, Hendrik; Brockmann, Klaus Josef; Benter, Thorsten
Gas Flow Dynamics in Inlet Capillaries: Evidence for non Laminar Conditions
Journal of The American Society for Mass Spectrometry, 27 (9) :1550-1563
2016
Herausgeber: Journal of The American Society for Mass Spectrometry3472.
Barnes, Ian; Wiesen, Peter
Gas-phase kinetic and mechanistic investigation of the OH radical and Cl atom oxidation of tetraethoxysilane
RSC Advances, 6 (102) :100577-100584
2016
Herausgeber: Royal Society of Chemistry3471.
Barnes, Ian; Wiesen, Peter
Gas-phase kinetic and mechanistic investigation of the OH radical and Cl atom oxidation of tetraethoxysilane
RSC Advances, 6 (102) :100577-100584
2016
Herausgeber: Royal Society of Chemistry