Model Order Reduction
Model Order Reduction (MOR) is the art of reducing a system's complexity while preserving its input-output behavior as much as possible.
Processes in all fields of todays technological world, like physics, chemistry and electronics, but also in finance, are very often described by dynamical systems. With the help of these dynamical systems, computer simulations, i.e. virtual experiments, are carried out. In this way, new products can be designed without having to build costly prototyps.
Due to the demand of more and more realistic simulations, the dynamical systems, i.e., the mathematical models, have to reflect more and more details of the real world problem. By this, the models' dimensions are increasing and simulations can often be carried out at high computational cost only.
In the design process, however, results are needed quickly. In circuit design, e.g., structures may need to be changed or parameters may need to be altered, in order to satisfy design rules or meet the prescribed performance. One cannot afford idle time, waiting for long simulation runs to be ready.
Model Order Reduction allows to speed up simulations in cases where one is not interested in all details of a system but merely in its input-output behavior. That means, considering a system, one may ask:
- How do varying parameters influence certain performances ?
Using the example of circuit design: How do widths and lengths of transistor channels, e.g., influence the voltage gain of a circuit. - Is a system stable?
Using the example of circuit design: In which frequency range, e.g., of voltage sources, does the circuit perform as expected - How do coupled subproblems interact?
Using the example of circuit design: How are signals applied at input-terminals translated to output-pins?
Classical situations in circuit design, where one does not need to know internals of blocks are optimization of design parameters (widths, lengths, ...) and post layout simulations and full system verifications. In the latter two cases, systems of coupled models are considered. In post layout simulations one has to deal with artificial, parasitic circuits, describing wiring effects.
Model Order Reduction automatically captures the essential features of a structure, omitting information which are not decisive for the answer to the above questions. Model Order reduction replaces in this way a dynamical system with another dynamical system producing (almost) the same output, given the same input with less internal states.
MOR replaces high dimensional (e.g. millions of degrees of freedom) with low dimensional (e.g. a hundred of degrees of freedom ) problems, that are then used instead in the numerical simulation.
The working group "Applied Mathematics/Numerical Analysis" has gathered expertise in MOR, especially in circuit design. Within the EU-Marie Curie Initial Training Network COMSON, attention was concentrated on MOR for Differential Algebraic Equations. Members that have been working on MOR in the EU-Marie Curie Transfer of Knowledge project O-MOORE-NICE! gathered knowledge especially in the still immature field of MOR for nonlinear problems.
Current research topics include:
- MOR for nonlinear, parameterized problems
- structure preserving MOR
- MOR for Differential Algebraic Equations
- MOR in financial applications, i.e., option prizing
Group members working on that field
- Jan ter Maten
- Roland Pulch
Publications
- 2018
3867.
Putek, Piotr; Janssen, Rick; Niehof, Jan; Maten, E Jan W; Pulch, Roland; Tasi{\'c}, Bratislav; Günther, Michael
Nanoelectronic COupled Problems Solutions: uncertainty quantification for analysis and optimization of an RFIC interference problem
Journal of Mathematics in Industry, 8 :1--19
2018
Herausgeber: Springer Berlin Heidelberg3866.
Putek, Piotr; Janssen, Rick; Niehof, Jan; Maten, E. Jan W.; Pulch, Roland; Tasic, Bratislav; Günther, Michael
Nanoelectronic COupled problems solutions: Uncertainty quantification for analysis and optimization of an RFIC interference problem
Journal of Mathematics in Industry, 8 (1) :1–19
2018
Herausgeber: Springer Verlag3865.
Putek, Piotr; Janssen, Rick; Niehof, Jan; Maten, E. Jan W.; Pulch, Roland; Tasic, Bratislav; Günther, Michael
Nanoelectronic COupled problems solutions: Uncertainty quantification for analysis and optimization of an RFIC interference problem
Journal of Mathematics in Industry, 8 (1) :1–19
2018
Herausgeber: Springer Verlag3864.
Putek, P.; Janssen, R.; Niehof, J.; Maten, E. J. W.; Pulch, R.; Tasic, B.; Günther, M.
Nanoelectronic Coupled Problems Solutions: Uncertainty quantification of {RFIC} interference
In Quintela, P. and Barral, P. and Gómez, D. and Pena, F.J. and Rodríguez, J. and Salgado, P. and Vázquez-Mendéz, M.E., Editor, Progress in Industrial Mathematics at ECMI 2016 Band 26 aus Mathematics in Industry
Seite 271--279
Herausgeber: Springer
2018
271--2793863.
Putek, Piotr; Janssen, Rick; Niehof, Jan; Maten, E. Jan W.; Pulch, Roland; Tasic, Bratislav; Günther, Michael
Nanoelectronic coupled problems solutions: Uncertainty quantification of RFIC interference
In Quintela, Peregrina and Barral, Patricia and Gómez, Dolores and Pena, Francisco J. and Rodríguez, Jerónimo and Salgado, Pilar and Vázquez-Mendéz, Miguel E., Editor, Progress in Industrial Mathematics at ECMI 2016ausMathematics in Industry, Seite 271–279
In Quintela, Peregrina and Barral, Patricia and Gómez, Dolores and Pena, Francisco J. and Rodríguez, Jerónimo and Salgado, Pilar and Vázquez-Mendéz, Miguel E., Editor
Herausgeber: Springer Cham
20183862.
Putek, Piotr; Janssen, Rick; Niehof, Jan; Maten, E. Jan W.; Pulch, Roland; Tasic, Bratislav; Günther, Michael
Nanoelectronic coupled problems solutions: Uncertainty quantification of RFIC interference
In Quintela, Peregrina and Barral, Patricia and Gómez, Dolores and Pena, Francisco J. and Rodríguez, Jerónimo and Salgado, Pilar and Vázquez-Mendéz, Miguel E., Editor, Progress in Industrial Mathematics at ECMI 2016ausMathematics in Industry, Seite 271–279
In Quintela, Peregrina and Barral, Patricia and Gómez, Dolores and Pena, Francisco J. and Rodríguez, Jerónimo and Salgado, Pilar and Vázquez-Mendéz, Miguel E., Editor
Herausgeber: Springer Cham
20183861.
Frommer, Andreas; Schimmel, Claudia; Schweitzer, Marcel
Non-Toeplitz decay bounds for inverses of Hermitian positive definite tridiagonal matrices
Electron. Trans. Numer. Anal., 48 :362-372
20183860.
Frommer, Andreas; Schimmel, Claudia; Schweitzer, Marcel
Non-Toeplitz decay bounds for inverses of Hermitian positive definite tridiagonal matrices
Electron. Trans. Numer. Anal., 48 :362-372
20183859.
Frommer, Andreas; Schimmel, Claudia; Schweitzer, Marcel
Non-Toeplitz decay bounds for inverses of Hermitian positive definite tridiagonal matrices
Electron. Trans. Numer. Anal., 48 :362-372
20183858.
Gabbana, A.; Mendoza, M.; Succi, S.; Tripiccione, R.
Numerical evidence of electron hydrodynamic whirlpools in graphene samples
Computers & Fluids, 172 :644–650
2018
Herausgeber: Elsevier3857.
Petrov, P.; Tyshchenko, A. G.; Ehrhardt, M.
Numerical solution of iterative parabolic equations approximating the nonlinear {Helmholtz} equation
Proceedings of the International Conference DAYS on DIFFRACTION 2018, St.Petersburg, Russia
20183856.
Ehrhardt, Matthias
Numerical solution of iterative parabolic equations approximating the nonlinear Helmholtz equation
2018 Days on Diffraction (DD), Seite 241–244
IEEE
Herausgeber: IEEE
20183855.
Ehrhardt, Matthias
Numerical solution of iterative parabolic equations approximating the nonlinear Helmholtz equation
2018 Days on Diffraction (DD), Seite 241--244
IEEE
20183854.
Ehrhardt, Matthias
Numerical solution of iterative parabolic equations approximating the nonlinear Helmholtz equation
2018 Days on Diffraction (DD), Seite 241–244
IEEE
Herausgeber: IEEE
20183853.
Ramadan, Leila
Offline-Pyrolyse GCxGC von Kunstoffpolymeren zur Analytik von Mikroplastik
20183852.
Ankirchner, Stefan; Klein, Maike; Kruse, Thomas; Urusov, Mikhail
On a certain local martingale in a general diffusion setting
20183851.
Bartel, Andreas; G\"unther, Michael
PDAEs in refined electrical network modeling
SIAM Review, 60 (1) :56--91
2018
Herausgeber: Society for Industrial and Applied Mathematics3850.
Bartel, Andreas; Günther, Michael
PDAEs in refined electrical network modeling
SIAM Review, 60 (1) :56--91
Januar 2018
Herausgeber: Society for Industrial and Applied Mathematics3849.
Bartel, Andreas; Günther, Michael
PDAEs in refined electrical network modeling
SIAM Review, 60 (1) :56–91
2018
Herausgeber: Society for Industrial and Applied Mathematics3848.
Bartel, Andreas; Günther, Michael
PDAEs in refined electrical network modeling
SIAM Review, 60 (1) :56–91
2018
Herausgeber: Society for Industrial and Applied Mathematics3847.
B{\'a}tkai, Andr{\'a}s; Jacob, Birgit; Voigt, Jürgen; Wintermayr, Jens
Perturbations of positive semigroups on {AM}-spaces
Semigroup Forum, 96 (2) :333--347
20183846.
Bátkai, András; Jacob, Birgit; Voigt, Jürgen; Wintermayr, Jens
Perturbations of positive semigroups on AM-spaces
Semigroup Forum, 96 (2) :333--347
20183845.
[english] Bohrmann-Linde, Claudia; Zeller, Diana
Photosensitizers for Photogalvanic Cells in the Chemistry Classroom
World Journal of Chemical Education, 6 (1) :36--42
2018
Herausgeber: Science and Education Publishing Co., Ltd.3844.
[english] Tausch, Michael W.
Phototactive Thin Films in Science Education
World Journal of Chemical Education, 6 (1) :14--17
2018
Herausgeber: Science and Education Publishing Co., Ltd.3843.
Bargetz, Christian; Wegner, Sven-Ake
Pivot duality of universal interpolation and extrapolation spaces
J. Math. Anal. Appl., 460 (1) :321--331
2018