Electric Networks

From the fully automatic coffee machine to the central processing units, electronic circuits and computer chips enhance the quality of our daily life. Since these circuits consist of millions of network elements, like resistors, capacitors, inductors and transistors, chip design relies strongly on circuit simulation. The computed electric behavior is used by the designer to rate and validate new developements before production.
Miniaturization of single elements and ultra high integration is the ongoing trend to enhance the performance of all electronic devices. It leads to smaller devices driven by higher frequencies and smaller signals and overall it leads from micro- to nanotechnolgy.
In turn, modern circuit simulators have to face several challenges: higher packing densities result in larger systems with increased power density, and smaller signals result in larger noise/signal ratio and thus stronger influence of parasitic effects, which could have been neglected before.
This leads to our ongoing research in the field of circuit simulation:
- Speed up of circuit simulation by identification of active and latent parts in electric circuits (Multirate)
- Model Order Reduction for parasitic circuits
- Coupling of circuit simulators with distributed device models (Dynamic Iteration, Semiconductors, Electromagnetic Field Devices)
Former and ongoing projects
Cooperations
- Academic
- Markus Clemens, Bergische Universität Wuppertal
- Herbert de Gersem, K.U. Leuven, Belgium
- Caren Tischendorf, Universität zu Köln, Germany
- Industrial
Publications
- 2018
3867.
Putek, Piotr; Janssen, Rick; Niehof, Jan; Maten, E Jan W; Pulch, Roland; Tasi{\'c}, Bratislav; Günther, Michael
Nanoelectronic COupled Problems Solutions: uncertainty quantification for analysis and optimization of an RFIC interference problem
Journal of Mathematics in Industry, 8 :1--19
2018
Herausgeber: Springer Berlin Heidelberg3866.
Putek, Piotr; Janssen, Rick; Niehof, Jan; Maten, E. Jan W.; Pulch, Roland; Tasic, Bratislav; Günther, Michael
Nanoelectronic COupled problems solutions: Uncertainty quantification for analysis and optimization of an RFIC interference problem
Journal of Mathematics in Industry, 8 (1) :1–19
2018
Herausgeber: Springer Verlag3865.
Putek, Piotr; Janssen, Rick; Niehof, Jan; Maten, E. Jan W.; Pulch, Roland; Tasic, Bratislav; Günther, Michael
Nanoelectronic COupled problems solutions: Uncertainty quantification for analysis and optimization of an RFIC interference problem
Journal of Mathematics in Industry, 8 (1) :1–19
2018
Herausgeber: Springer Verlag3864.
Putek, P.; Janssen, R.; Niehof, J.; Maten, E. J. W.; Pulch, R.; Tasic, B.; Günther, M.
Nanoelectronic Coupled Problems Solutions: Uncertainty quantification of {RFIC} interference
In Quintela, P. and Barral, P. and Gómez, D. and Pena, F.J. and Rodríguez, J. and Salgado, P. and Vázquez-Mendéz, M.E., Editor, Progress in Industrial Mathematics at ECMI 2016 Band 26 aus Mathematics in Industry
Seite 271--279
Herausgeber: Springer
2018
271--2793863.
Putek, Piotr; Janssen, Rick; Niehof, Jan; Maten, E. Jan W.; Pulch, Roland; Tasic, Bratislav; Günther, Michael
Nanoelectronic coupled problems solutions: Uncertainty quantification of RFIC interference
In Quintela, Peregrina and Barral, Patricia and Gómez, Dolores and Pena, Francisco J. and Rodríguez, Jerónimo and Salgado, Pilar and Vázquez-Mendéz, Miguel E., Editor, Progress in Industrial Mathematics at ECMI 2016ausMathematics in Industry, Seite 271–279
In Quintela, Peregrina and Barral, Patricia and Gómez, Dolores and Pena, Francisco J. and Rodríguez, Jerónimo and Salgado, Pilar and Vázquez-Mendéz, Miguel E., Editor
Herausgeber: Springer Cham
20183862.
Putek, Piotr; Janssen, Rick; Niehof, Jan; Maten, E. Jan W.; Pulch, Roland; Tasic, Bratislav; Günther, Michael
Nanoelectronic coupled problems solutions: Uncertainty quantification of RFIC interference
In Quintela, Peregrina and Barral, Patricia and Gómez, Dolores and Pena, Francisco J. and Rodríguez, Jerónimo and Salgado, Pilar and Vázquez-Mendéz, Miguel E., Editor, Progress in Industrial Mathematics at ECMI 2016ausMathematics in Industry, Seite 271–279
In Quintela, Peregrina and Barral, Patricia and Gómez, Dolores and Pena, Francisco J. and Rodríguez, Jerónimo and Salgado, Pilar and Vázquez-Mendéz, Miguel E., Editor
Herausgeber: Springer Cham
20183861.
Frommer, Andreas; Schimmel, Claudia; Schweitzer, Marcel
Non-Toeplitz decay bounds for inverses of Hermitian positive definite tridiagonal matrices
Electron. Trans. Numer. Anal., 48 :362-372
20183860.
Frommer, Andreas; Schimmel, Claudia; Schweitzer, Marcel
Non-Toeplitz decay bounds for inverses of Hermitian positive definite tridiagonal matrices
Electron. Trans. Numer. Anal., 48 :362-372
20183859.
Frommer, Andreas; Schimmel, Claudia; Schweitzer, Marcel
Non-Toeplitz decay bounds for inverses of Hermitian positive definite tridiagonal matrices
Electron. Trans. Numer. Anal., 48 :362-372
20183858.
Gabbana, A.; Mendoza, M.; Succi, S.; Tripiccione, R.
Numerical evidence of electron hydrodynamic whirlpools in graphene samples
Computers & Fluids, 172 :644–650
2018
Herausgeber: Elsevier3857.
Petrov, P.; Tyshchenko, A. G.; Ehrhardt, M.
Numerical solution of iterative parabolic equations approximating the nonlinear {Helmholtz} equation
Proceedings of the International Conference DAYS on DIFFRACTION 2018, St.Petersburg, Russia
20183856.
Ehrhardt, Matthias
Numerical solution of iterative parabolic equations approximating the nonlinear Helmholtz equation
2018 Days on Diffraction (DD), Seite 241–244
IEEE
Herausgeber: IEEE
20183855.
Ehrhardt, Matthias
Numerical solution of iterative parabolic equations approximating the nonlinear Helmholtz equation
2018 Days on Diffraction (DD), Seite 241--244
IEEE
20183854.
Ehrhardt, Matthias
Numerical solution of iterative parabolic equations approximating the nonlinear Helmholtz equation
2018 Days on Diffraction (DD), Seite 241–244
IEEE
Herausgeber: IEEE
20183853.
Ramadan, Leila
Offline-Pyrolyse GCxGC von Kunstoffpolymeren zur Analytik von Mikroplastik
20183852.
Ankirchner, Stefan; Klein, Maike; Kruse, Thomas; Urusov, Mikhail
On a certain local martingale in a general diffusion setting
20183851.
Bartel, Andreas; G\"unther, Michael
PDAEs in refined electrical network modeling
SIAM Review, 60 (1) :56--91
2018
Herausgeber: Society for Industrial and Applied Mathematics3850.
Bartel, Andreas; Günther, Michael
PDAEs in refined electrical network modeling
SIAM Review, 60 (1) :56--91
Januar 2018
Herausgeber: Society for Industrial and Applied Mathematics3849.
Bartel, Andreas; Günther, Michael
PDAEs in refined electrical network modeling
SIAM Review, 60 (1) :56–91
2018
Herausgeber: Society for Industrial and Applied Mathematics3848.
Bartel, Andreas; Günther, Michael
PDAEs in refined electrical network modeling
SIAM Review, 60 (1) :56–91
2018
Herausgeber: Society for Industrial and Applied Mathematics3847.
B{\'a}tkai, Andr{\'a}s; Jacob, Birgit; Voigt, Jürgen; Wintermayr, Jens
Perturbations of positive semigroups on {AM}-spaces
Semigroup Forum, 96 (2) :333--347
20183846.
Bátkai, András; Jacob, Birgit; Voigt, Jürgen; Wintermayr, Jens
Perturbations of positive semigroups on AM-spaces
Semigroup Forum, 96 (2) :333--347
20183845.
[english] Bohrmann-Linde, Claudia; Zeller, Diana
Photosensitizers for Photogalvanic Cells in the Chemistry Classroom
World Journal of Chemical Education, 6 (1) :36--42
2018
Herausgeber: Science and Education Publishing Co., Ltd.3844.
[english] Tausch, Michael W.
Phototactive Thin Films in Science Education
World Journal of Chemical Education, 6 (1) :14--17
2018
Herausgeber: Science and Education Publishing Co., Ltd.3843.
Bargetz, Christian; Wegner, Sven-Ake
Pivot duality of universal interpolation and extrapolation spaces
J. Math. Anal. Appl., 460 (1) :321--331
2018