Electric Networks

From the fully automatic coffee machine to the central processing units, electronic circuits and computer chips enhance the quality of our daily life. Since these circuits consist of millions of network elements, like resistors, capacitors, inductors and transistors, chip design relies strongly on circuit simulation. The computed electric behavior is used by the designer to rate and validate new developements before production.
Miniaturization of single elements and ultra high integration is the ongoing trend to enhance the performance of all electronic devices. It leads to smaller devices driven by higher frequencies and smaller signals and overall it leads from micro- to nanotechnolgy.
In turn, modern circuit simulators have to face several challenges: higher packing densities result in larger systems with increased power density, and smaller signals result in larger noise/signal ratio and thus stronger influence of parasitic effects, which could have been neglected before.
This leads to our ongoing research in the field of circuit simulation:
- Speed up of circuit simulation by identification of active and latent parts in electric circuits (Multirate)
- Model Order Reduction for parasitic circuits
- Coupling of circuit simulators with distributed device models (Dynamic Iteration, Semiconductors, Electromagnetic Field Devices)
Former and ongoing projects
Cooperations
- Academic
- Markus Clemens, Bergische Universität Wuppertal
- Herbert de Gersem, K.U. Leuven, Belgium
- Caren Tischendorf, Universität zu Köln, Germany
- Industrial
Publications
- 2019
4042.
Wißdorf, Walter; Lorenz, Matthias; Brockmann, Klaus Josef; Benter, Thorsten
Systematic Ion Source Parameter Assessment by Automated Determination of the Distribution of Ion Acceptance (DIA) Using APLI
Journal of The American Society for Mass Spectrometry, 30 (7) :1262-1275
2019
Herausgeber: Journal of The American Society for Mass Spectrometry4041.
Wissdorf, Walter; Lorenz, Matthias; Brockmann, Klaus Josef; Benter, Thorsten
Systematic Ion Source Parameter Assessment by Automated Determination of the Distribution of Ion Acceptance (DIA) Using APLI
Journal of The American Society for Mass Spectrometry, 30 (7) :1262-1275
2019
Herausgeber: Journal of The American Society for Mass Spectrometry4040.
[english] Grandrath, Rebecca; Bohrmann-Linde, Claudia
Teaching Sustainability in the Chemistry Classroom: Exploring Fuel Cells in Simple Hands-on Experiments with Hydrogen, Sugar and Alcohol
World Journal of Chemical Education, 7 (2) :172-178
2019
ISSN: 2375-16574039.
Janssen, Rick; Gillon, Renaud; Wieers, Aarnout; Deleu, Frederik; Guegnaud, Hervé; Reynier, Pascal; Schoenmaker, Wim; Maten, E. Jan W.
Test cases for power-MOS devices and RF-circuitry
In ter Maten, E. Jan W. and Brachtendorf, Hans-Georg and Pulch, Roland and Schoenmaker, Wim and De Gersem, Herbert, Editor aus Mathematics in Industry
Seite 459–485
Herausgeber: Springer Cham
2019
459–4854038.
Ehrhardt, Matthias; Günther, Michael
The 2D tree--grid method
Journal of Computational Finance
20194037.
Biallas, Phillip; Mensak, Tobias M.; Kunz, Kevin-Alexander
The Deazidoalkoxylation: Sequential Nucleophilic Substitutions with Diazidated Diethyl Malonate
The Journal of Organic Chemistry, 84 (3) :1654–1663
2019
ISSN: 0022-32634036.
Ferrari, Paola; Furci, Isabella; Hon, Sean; Mursaleen, Mohammad Ayman; Serra-Capizzano, Stefano
The eigenvalue distribution of special 2-by-2 block matrix-sequences with applications to the case of symmetrized Toeplitz structures
SIAM J. Matrix Anal. Appl., 40 (3) :1066-1086
20194035.
Ferrari, Paola; Furci, Isabella; Hon, Sean; Mursaleen, Mohammad Ayman; Serra-Capizzano, Stefano
The eigenvalue distribution of special 2-by-2 block matrix-sequences with applications to the case of symmetrized Toeplitz structures
SIAM J. Matrix Anal. Appl., 40 (3) :1066-1086
2019
ISSN: 0895-47984034.
Ferrari, Paola; Furci, Isabella; Hon, Sean; Mursaleen, Mohammad Ayman; Serra-Capizzano, Stefano
The eigenvalue distribution of special 2-by-2 block matrix-sequences with applications to the case of symmetrized Toeplitz structures
SIAM J. Matrix Anal. Appl., 40 (3) :1066-1086
2019
ISSN: 0895-47984033.
Kruse, Thomas; Schneider, Judith C; Schweizer, Nikolaus
The joint impact of F-divergences and reference models on the contents of uncertainty sets
Operations Research, 67 (2) :428--435
2019
Herausgeber: INFORMS4032.
Kruse, Thomas; Schneider, Judith; Schweizer, Nikolaus
The joint impact of F-divergences and reference models on the contents of uncertainty sets
Operations Research, 67 (2) :428–435
2019
Herausgeber: INFORMS4031.
Bunker, Philip R.; Mills, Ian M.; Jensen, Per
The Planck constant and its units
Journal of Quantitative Spectroscopy and Radiative Transfer, 237 :106594
20194030.
Bunker, Philip R.; Mills, Ian M.; Jensen, Per
The Planck constant and its units
Journal of Quantitative Spectroscopy and Radiative Transfer, 237 :106594
20194029.
Bunker, Philip R.; Mills, Ian M.; Jensen, Per
The Planck constant and its units
Journal of Quantitative Spectroscopy and Radiative Transfer, 237 :106594
20194028.
Ehrhardt, Matthias; Günther, Michael
The Two-Dimensional Tree--Grid Method
Journal of Computational Finance, Forthcoming
20194027.
Kossaczky, Igor; Ehrhardt, Matthias; Günther, Michael
The two-dimensional tree-grid method
Journal of Computational Finance, 23 (2) :29–57
2019
Herausgeber: Incisive Media4026.
Kossaczky, Igor; Ehrhardt, Matthias
The two-dimensional tree-grid method
JOURNAL OF COMPUTATIONAL FINANCE, 23 (2) :29--57
2019
Herausgeber: INCISIVE MEDIA HAYMARKET HOUSE, 28-29 HAYMARKET, LONDON, SW1Y 4RX, ENGLAND4025.
Kossaczky, Igor; Ehrhardt, Matthias; Günther, Michael
The two-dimensional tree-grid method
Journal of Computational Finance, 23 (2) :29–57
2019
Herausgeber: Incisive Media4024.
Kossaczky, Igor; Ehrhardt, Matthias; Günther, Michael
The two-dimensional tree-grid method
Journal of Computational Finance, 23 (2) :29–57
2019
Herausgeber: Incisive Media4023.
Palma-Cando, A.; Rendon-Enriquez, Ibeth; Tausch, Michael W.; Scherf, U.
Thin Functional Polymer Films by Electropolymerization
Nanomaterials, 9 (8) :1125
20194022.
[english] Kremer, Richard; Meuter, Nico; Tausch, Michael W.
Towards Artificial Photosynthesis - Promoting Microscale Photochemistry in Science Education
African Journal of Chemical Education, 9 (3) :120-134
20194021.
[english] Brunnert, Rainer; Yurdanur, Yasemin; Tausch, Michael W.
Towards Artificial Photosynthesis in Science Education
World Journal of Chemical Education, 7 (2) :33--39
2019
Herausgeber: Science and Education Publishing Co., Ltd.4020.
Mellor, Thomas M.; Yurchenko, Sergey N.; Mant, Barry P.; Jensen, Per
Transformation Properties under the Operations of the Molecular Symmetry Groups G\(_{36}\) and G\(_{36}\)(EM) of Ethane H\(_{3}\)CCH\(_{3}\)
Symmetry, 11 (7) :862
20194019.
Mellor, Thomas M.; Yurchenko, Sergey N.; Mant, Barry P.; Jensen, Per
Transformation Properties under the Operations of the Molecular Symmetry Groups G\(_{36}\) and G\(_{36}\)(EM) of Ethane H\(_{3}\)CCH\(_{3}\)
Symmetry, 11 (7) :862
20194018.
Mellor, Thomas M.; Yurchenko, Sergey N.; Mant, Barry P.; Jensen, Per
Transformation Properties under the Operations of the Molecular Symmetry Groups G36 and G36(EM) of Ethane H3CCH3
Symmetry, 11 (7) :862
2019