Electric Networks

From the fully automatic coffee machine to the central processing units, electronic circuits and computer chips enhance the quality of our daily life. Since these circuits consist of millions of network elements, like resistors, capacitors, inductors and transistors, chip design relies strongly on circuit simulation. The computed electric behavior is used by the designer to rate and validate new developements before production.
Miniaturization of single elements and ultra high integration is the ongoing trend to enhance the performance of all electronic devices. It leads to smaller devices driven by higher frequencies and smaller signals and overall it leads from micro- to nanotechnolgy.
In turn, modern circuit simulators have to face several challenges: higher packing densities result in larger systems with increased power density, and smaller signals result in larger noise/signal ratio and thus stronger influence of parasitic effects, which could have been neglected before.
This leads to our ongoing research in the field of circuit simulation:
- Speed up of circuit simulation by identification of active and latent parts in electric circuits (Multirate)
- Model Order Reduction for parasitic circuits
- Coupling of circuit simulators with distributed device models (Dynamic Iteration, Semiconductors, Electromagnetic Field Devices)
Former and ongoing projects
Cooperations
- Academic
- Markus Clemens, Bergische Universität Wuppertal
- Herbert de Gersem, K.U. Leuven, Belgium
- Caren Tischendorf, Universität zu Köln, Germany
- Industrial
Publications
- 2004
1341.
Jacob, Birgit; Partington, Jonathan R.
Admissibility of control and observation operators for semigroups: a survey
, Current trends in operator theory and its applications Band 149 aus Oper. Theory Adv. Appl.
Seite 199--221
Herausgeber: Birkhäuser, Basel
2004
199--2211340.
Jacob, Birgit; Partington, Jonathan R.
Admissible control and observation operators for Volterra integral equations
J. Evol. Equ., 4 (3) :333--343
20041339.
Klamroth, Kathrin
Algebraic properties of location problems with one circular barrier
European Journal of Operational Research, 154 :20-35
20041338.
Ehrgott, Matthias; Klamroth, Kathrin; Schwehm, Christian
An MCDM approach to portfolio optimization
European Journal of Operational Research, 155 :752-770
20041337.
Tausch, Michael W.; Wachtendonk, Magdalene; Bohrmann-Linde, Claudia; Krollmann, P.; Schmitz, W.; Wambach-Laicher, J.
CHEMIE 2000+ Band 3.1, Lehrbuch für die gymnasiale Oberstufe
Herausgeber: C.C.Buchner, Bamberg
20041336.
Bunker, Philip R.; Jensen, Per
Chirality in rotational energy level clusters
Journal of Molecular Spectroscopy, 228 (2) :640-644
2004
Herausgeber: Academic Press1335.
Bunker, Philip R.; Jensen, Per
Chirality in rotational energy level clusters
Journal of Molecular Spectroscopy, 228 (2) :640-644
2004
Herausgeber: Academic Press1334.
Bunker, Philip R.; Jensen, Per
Chirality in rotational energy level clusters
Journal of Molecular Spectroscopy, 228 (2) :640-644
2004
Herausgeber: Academic Press1333.
Jacob, Birgit; Zwart, Hans
Counterexamples concerning observation operators for C_0-semigroups
SIAM J. Control Optim., 43 (1) :137--153
20041332.
Tausch, Michael W.
Curriculare Innovation
Praxis der Naturwissenschaften - Chemie in der Schule, 53 (8) :18--21
20041331.
Appel, Matthew F.; Short, Luke Chandler; Benter, Thorsten
Development of medium pressure laser ionization, MPLI. Description of the MPLI ion source
Journal of the American Society for Mass Spectrometry, 15 (12) :1885-1896
20041330.
Appel, Matthew F.; Short, Luke Chandler; Benter, Thorsten
Development of medium pressure laser ionization, MPLI. Description of the MPLI ion source
Journal of the American Society for Mass Spectrometry, 15 (12) :1885-1896
20041329.
Appel, Matthew F.; Short, Luke Chandler; Benter, Thorsten
Development of medium pressure laser ionization, MPLI. Description of the MPLI ion source
Journal of the American Society for Mass Spectrometry, 15 (12) :1885-1896
20041328.
Stiglmayr, Michael
Die Bedeutung von Abstandsmaßen in der Data Envelopment Analysis
Diploma Thesis
Diploma Thesis
Universität Erlangen - Nürnberg, Institut für Angewandte Mathematik
20041327.
Tausch, Michael W.; Maibaum, R.; Seesing, M.; Knauf, U.; Twellmann, M.; Grolmuss, A.; Schmitz, R.-P-; Zimnol, V.; Trzaska, T.; Szemenyei, M.
DISCOVERING SILICONES DOCUMENTATION, CD-ROM
Online / CD-Rom
20041326.
Ehrhardt, Matthias
Discrete Transparent Boundary Conditions for Time-Dependent Systems of Schrödinger Equations
20041325.
Ehrhardt, Matthias
Discrete transparent boundary conditions for time-dependent systems of Schrödinger equations
Preprint, Research Center Matheon :1–26
2004
Herausgeber: Technische Universität Berlin1324.
Ehrhardt, Matthias
Discrete transparent boundary conditions for wide angle parabolic equations: Fast calculation and approximation
:9--14
20041323.
Ehrhardt, Matthias
Discrete transparent boundary conditions for wide angle parabolic equations: Fast calculation and approximation
Seventh European Conference on Underwater Acoustics, Seite 9–14
20041322.
Simeon, Bernd; Günther, Michael; Schaub, Meike
Einführung in MATLAB
20041321.
Tausch, Michael W.
Excited States ... the Heart of all Photoprocesses
Praxis der Naturwissenschaften - Chemie in der Schule, 53 (3) :1
20041320.
Tausch, Michael W.; Gärtner, F.
Fluoreszenzkollektoren
Praxis der Naturwissenschaften - Chemie in der Schule, 53 (3) :20
20041319.
Kleffmann, Jörg; Benter, Thorsten; Wiesen, Peter
Heterogeneous reaction of nitric acid with nitric oxide on glass surfaces under simulated atmospheric conditions
Journal of Physical Chemistry A, 108 (27) :5793-5799
20041318.
Kleffmann, Jörg; Benter, Thorsten; Wiesen, Peter
Heterogeneous reaction of nitric acid with nitric oxide on glass surfaces under simulated atmospheric conditions
Journal of Physical Chemistry A, 108 (27) :5793-5799
20041317.
Kleffmann, Jörg; Benter, Thorsten; Wiesen, Peter
Heterogeneous reaction of nitric acid with nitric oxide on glass surfaces under simulated atmospheric conditions
Journal of Physical Chemistry A, 108 (27) :5793-5799
2004