Electric Networks

From the fully automatic coffee machine to the central processing units, electronic circuits and computer chips enhance the quality of our daily life. Since these circuits consist of millions of network elements, like resistors, capacitors, inductors and transistors, chip design relies strongly on circuit simulation. The computed electric behavior is used by the designer to rate and validate new developements before production.
Miniaturization of single elements and ultra high integration is the ongoing trend to enhance the performance of all electronic devices. It leads to smaller devices driven by higher frequencies and smaller signals and overall it leads from micro- to nanotechnolgy.
In turn, modern circuit simulators have to face several challenges: higher packing densities result in larger systems with increased power density, and smaller signals result in larger noise/signal ratio and thus stronger influence of parasitic effects, which could have been neglected before.
This leads to our ongoing research in the field of circuit simulation:
- Speed up of circuit simulation by identification of active and latent parts in electric circuits (Multirate)
- Model Order Reduction for parasitic circuits
- Coupling of circuit simulators with distributed device models (Dynamic Iteration, Semiconductors, Electromagnetic Field Devices)
Former and ongoing projects
Cooperations
- Academic
- Markus Clemens, Bergische Universität Wuppertal
- Herbert de Gersem, K.U. Leuven, Belgium
- Caren Tischendorf, Universität zu Köln, Germany
- Industrial
Publications
- 1996
667.
Wiesen, Peter; Kleffmann, Jörg; Kurtenbach, Ralf; Becker, Karl Heinz
Emission of nitrous oxide and methane from aero engines: Monitoring by tunable diode laser spectroscopy
Infrared Physics and Technology, 37 (1) :75-81
1996
Herausgeber: Pergamon666.
Hamacher, Horst W.; Klamroth, Kathrin; Nickel, Stefan
EWGLA 8 Proceedings
Band 10 aus Special Issue of Studies in Locational Analysis
1996665.
Bunker, Philip R.; Jensen, Per; Yamaguchi, Yukio; Schaefer, Henry F.
High-level ab initio calculation of the rotation-vibration energies in the c\verb=~= \(^{1}\)A\(_{1}\) state of methylene, CH\(_{2}\)
Journal of Physical Chemistry, 100 (46) :18088-18092
1996664.
Bunker, Philip R.; Jensen, Per; Yamaguchi, Yukio; Schaefer, Henry F.
High-level ab initio calculation of the rotation-vibration energies in the c\verb=~= \(^{1}\)A\(_{1}\) state of methylene, CH\(_{2}\)
Journal of Physical Chemistry, 100 (46) :18088-18092
1996663.
Bunker, Philip R.; Jensen, Per; Yamaguchi, Yukio; Schaefer, Henry F.
High-level ab initio calculation of the rotation-vibration energies in the c~ 1A1 state of methylene, CH2
Journal of Physical Chemistry, 100 (46) :18088-18092
1996662.
Fink, Ewald H.; Setzer, Klaus-Dieter; Ramsay, D. A.; Towle, J. P.; Brown, John M.
High-Resolution Study of the X\(_{2}\)1 → X\(_{1}\)0\(^{+}\) Fine-Structure Transition of BiF
Journal of Molecular Spectroscopy, 178 (2) :143-156
1996
Herausgeber: Academic Press661.
Fink, Ewald H.; Setzer, Klaus-Dieter; Ramsay, D. A.; Towle, J. P.; Brown, John M.
High-Resolution Study of the X\(_{2}\)1 → X\(_{1}\)0\(^{+}\) Fine-Structure Transition of BiF
Journal of Molecular Spectroscopy, 178 (2) :143-156
1996
Herausgeber: Academic Press660.
Fink, Ewald H.; Setzer, Klaus-Dieter; Ramsay, D. A.; Towle, J. P.; Brown, John M.
High-Resolution Study of the X21 → X10+ Fine-Structure Transition of BiF
Journal of Molecular Spectroscopy, 178 (2) :143-156
1996
Herausgeber: Academic Press659.
Becker, Karl Heinz; Geiger, Harald; Wiesen, Peter
Kinetics of the reaction CH + N\(_{2}\) [M]→ Products in the range 10-620 torr and 298-1059 K
International Journal of Chemical Kinetics, 28 (2) :115-123
1996658.
Becker, Karl Heinz; Geiger, Harald; Wiesen, Peter
Kinetics of the reaction CH + N\(_{2}\) [M]→ Products in the range 10-620 torr and 298-1059 K
International Journal of Chemical Kinetics, 28 (2) :115-123
1996657.
Becker, Karl Heinz; Geiger, Harald; Wiesen, Peter
Kinetics of the reaction CH + N2 [M]→ Products in the range 10-620 torr and 298-1059 K
International Journal of Chemical Kinetics, 28 (2) :115-123
1996656.
G\"unther, Michael; Denk, G.; Feldmann, U.
Modeling and simulating charge sensitive {MOS} circuits
Math. Modelling of Systems, 2 :69--81
1996655.
Günther, Michael; Denk, Georg; Feldmann, Uwe
Modeling and simulating charge sensitive MOS circuits
Mathematical Modelling of Systems, 2 (1) :69–81
1996
Herausgeber: Taylor & Francis654.
Denk, G; Feldmann, U
Modelling and simulating charge sensitive MOS circuits
Mathematical Modelling of Systems, 2 (1) :69--81
1996
Herausgeber: Taylor \& Francis653.
Günther, Michael; Hoschek, Markus
Modified ROW methods for electric circuit simulation packages
Preprint (1864)
1996
Herausgeber: Technische Hochschule Darmstadt652.
Günther, Michael
Numerical solution of differential-algebraic equations in electric circuit simulation
In Neunzert, Helmut, Editor
Seite 285–294
Herausgeber: Vieweg+ Teubner
1996
285–294651.
Günther, Michael
Numerical solution of differential-algebraic equations in electric circuit simulation
Progress in Industrial Mathematics at ECMI 94 :285--294
1996
Herausgeber: Vieweg+ Teubner Verlag650.
Denk, Georg; Günther, Michael; Simeon, Bernd
Numerische simulation in chip-design und fahrzeugtechnik
Preprint (1841)
1996
Herausgeber: Technische Hochschule Darmstadt649.
GrÄb, Robert; Günther, Michael; Wever, Utz; Zheng, Qinghua
Optimization of parallel multilevel-Newton algorithms on workstation clusters
In Bougé, Luc and Fraigniaud, Pierre and Mignotte, Anne and Robert, Yves, Editor, Euro-Par96 Parallel ProcessingBand1124ausLecture Notes in Computer Science, Seite 91–96
In Bougé, Luc and Fraigniaud, Pierre and Mignotte, Anne and Robert, Yves, Editor
Herausgeber: Springer Berlin Heidelberg
1996648.
GrÄb, Robert; Günther, Michael; Wever, Utz; Zheng, Qinghua
Optimization of parallel multilevel-Newton algorithms on workstation clusters
In L. Bouge and et al., Editor, Euro-Par'96 Parallel Processing: Second International Euro-Par Conference Lyon, France, August 26--29, 1996 Proceedings, Volume II 2Band1124ausLecture Notes in Computer Science, Seite 91--96
Springer Berlin Heidelberg
In L. Bouge and et al., Editor
Herausgeber: Berlin, Springer-Verlag
1996647.
Klamroth, Kathrin; Mengersen, Ingrid
Ramsey numbers of K_3 versus (p,q)-graphs
Ars Combinatoria, 43 :107-120
1996646.
Becker, Karl Heinz; Kleffmann, Jörg; Kurtenbach, Ralf; Wiesen, Peter
Solubility of nitrous acid (HONO) in sulfuric acid solutions
Journal of Physical Chemistry, 100 (36) :14984-14990
1996645.
Becker, Karl Heinz; Kleffmann, Jörg; Kurtenbach, Ralf; Wiesen, Peter
Solubility of nitrous acid (HONO) in sulfuric acid solutions
Journal of Physical Chemistry, 100 (36) :14984-14990
1996644.
Becker, Karl Heinz; Kleffmann, Jörg; Kurtenbach, Ralf; Wiesen, Peter
Solubility of nitrous acid (HONO) in sulfuric acid solutions
Journal of Physical Chemistry, 100 (36) :14984-14990
1996643.
Tausch, Michael W.; Wachtendonk, M.; Porth, H.-R.; Schulze, I.; Wambach, H.
STOFF-FORMEL-UMWELT, CHEMIE S I
Herausgeber: C. C. Buchner, Bamberg
1996