Multirate

Highly integrated electric cicuits show a phenomenon called latency. That is, a processed signal causes activity only in a small subset of the whole circuit (imagine a central processing unit), whereas the other part of the system behaves almost constant over some time - is latent. Such an electric system can be described as coupled system, where the waveforms show different time scales, also refered to as multirate.
More generally, any coupled problem formulation due to coupled physical effects, may cause a multirate problem: image the simulation of car driving on the road, there you need a model for the wheel, the chassis, the dampers, the road,... (cf. co-simulation). Again each system is covered by their own time constant, which might vary over several orders of magnitude comparing different subsystems.
Classical methods cannot exploit this multirate potential, but resolve everything on the finest scale. This causes an over sampling of the latent components. In constrast, Co-simulation or especially dedicated multirate methods are designed to use the inherent step size to resolve the time-domain behaviour of each subystem with the required accuracy. This requires a time-stepping for each.
Group members working in that field
- Andreas Bartel
- Michael Günther
Former and ongoing Projects
- CoMSON
- ICESTARS
- 03GUNAVN
Cooperations
- Herbert de Gersem, K.U. Leuven, Belgium
- Jan ter Maten, TU Eindhoven and NXP, the Netherlands
Publications
- 2018
3867.
Putek, Piotr; Janssen, Rick; Niehof, Jan; Maten, E Jan W; Pulch, Roland; Tasi{\'c}, Bratislav; Günther, Michael
Nanoelectronic COupled Problems Solutions: uncertainty quantification for analysis and optimization of an RFIC interference problem
Journal of Mathematics in Industry, 8 :1--19
2018
Publisher: Springer Berlin Heidelberg3866.
Putek, Piotr; Janssen, Rick; Niehof, Jan; Maten, E. Jan W.; Pulch, Roland; Tasic, Bratislav; Günther, Michael
Nanoelectronic COupled problems solutions: Uncertainty quantification for analysis and optimization of an RFIC interference problem
Journal of Mathematics in Industry, 8 (1) :1–19
2018
Publisher: Springer Verlag3865.
Putek, Piotr; Janssen, Rick; Niehof, Jan; Maten, E. Jan W.; Pulch, Roland; Tasic, Bratislav; Günther, Michael
Nanoelectronic COupled problems solutions: Uncertainty quantification for analysis and optimization of an RFIC interference problem
Journal of Mathematics in Industry, 8 (1) :1–19
2018
Publisher: Springer Verlag3864.
Putek, P.; Janssen, R.; Niehof, J.; Maten, E. J. W.; Pulch, R.; Tasic, B.; Günther, M.
Nanoelectronic Coupled Problems Solutions: Uncertainty quantification of {RFIC} interference
In Quintela, P. and Barral, P. and Gómez, D. and Pena, F.J. and Rodríguez, J. and Salgado, P. and Vázquez-Mendéz, M.E., Editor, Progress in Industrial Mathematics at ECMI 2016 Volume 26 from Mathematics in Industry
Page 271--279
Publisher: Springer
2018
271--2793863.
Putek, Piotr; Janssen, Rick; Niehof, Jan; Maten, E. Jan W.; Pulch, Roland; Tasic, Bratislav; Günther, Michael
Nanoelectronic coupled problems solutions: Uncertainty quantification of RFIC interference
In Quintela, Peregrina and Barral, Patricia and Gómez, Dolores and Pena, Francisco J. and Rodríguez, Jerónimo and Salgado, Pilar and Vázquez-Mendéz, Miguel E., Editor, Progress in Industrial Mathematics at ECMI 2016fromMathematics in Industry, Page 271–279
In Quintela, Peregrina and Barral, Patricia and Gómez, Dolores and Pena, Francisco J. and Rodríguez, Jerónimo and Salgado, Pilar and Vázquez-Mendéz, Miguel E., Editor
Publisher: Springer Cham
20183862.
Putek, Piotr; Janssen, Rick; Niehof, Jan; Maten, E. Jan W.; Pulch, Roland; Tasic, Bratislav; Günther, Michael
Nanoelectronic coupled problems solutions: Uncertainty quantification of RFIC interference
In Quintela, Peregrina and Barral, Patricia and Gómez, Dolores and Pena, Francisco J. and Rodríguez, Jerónimo and Salgado, Pilar and Vázquez-Mendéz, Miguel E., Editor, Progress in Industrial Mathematics at ECMI 2016fromMathematics in Industry, Page 271–279
In Quintela, Peregrina and Barral, Patricia and Gómez, Dolores and Pena, Francisco J. and Rodríguez, Jerónimo and Salgado, Pilar and Vázquez-Mendéz, Miguel E., Editor
Publisher: Springer Cham
20183861.
Frommer, Andreas; Schimmel, Claudia; Schweitzer, Marcel
Non-Toeplitz decay bounds for inverses of Hermitian positive definite tridiagonal matrices
Electron. Trans. Numer. Anal., 48 :362-372
20183860.
Frommer, Andreas; Schimmel, Claudia; Schweitzer, Marcel
Non-Toeplitz decay bounds for inverses of Hermitian positive definite tridiagonal matrices
Electron. Trans. Numer. Anal., 48 :362-372
20183859.
Frommer, Andreas; Schimmel, Claudia; Schweitzer, Marcel
Non-Toeplitz decay bounds for inverses of Hermitian positive definite tridiagonal matrices
Electron. Trans. Numer. Anal., 48 :362-372
20183858.
Gabbana, A.; Mendoza, M.; Succi, S.; Tripiccione, R.
Numerical evidence of electron hydrodynamic whirlpools in graphene samples
Computers & Fluids, 172 :644–650
2018
Publisher: Elsevier3857.
Petrov, P.; Tyshchenko, A. G.; Ehrhardt, M.
Numerical solution of iterative parabolic equations approximating the nonlinear {Helmholtz} equation
Proceedings of the International Conference DAYS on DIFFRACTION 2018, St.Petersburg, Russia
20183856.
Ehrhardt, Matthias
Numerical solution of iterative parabolic equations approximating the nonlinear Helmholtz equation
2018 Days on Diffraction (DD), Page 241–244
IEEE
Publisher: IEEE
20183855.
Ehrhardt, Matthias
Numerical solution of iterative parabolic equations approximating the nonlinear Helmholtz equation
2018 Days on Diffraction (DD), Page 241--244
IEEE
20183854.
Ehrhardt, Matthias
Numerical solution of iterative parabolic equations approximating the nonlinear Helmholtz equation
2018 Days on Diffraction (DD), Page 241–244
IEEE
Publisher: IEEE
20183853.
Ramadan, Leila
Offline-Pyrolyse GCxGC von Kunstoffpolymeren zur Analytik von Mikroplastik
20183852.
Ankirchner, Stefan; Klein, Maike; Kruse, Thomas; Urusov, Mikhail
On a certain local martingale in a general diffusion setting
20183851.
Bartel, Andreas; G\"unther, Michael
PDAEs in refined electrical network modeling
SIAM Review, 60 (1) :56--91
2018
Publisher: Society for Industrial and Applied Mathematics3850.
Bartel, Andreas; Günther, Michael
PDAEs in refined electrical network modeling
SIAM Review, 60 (1) :56--91
January 2018
Publisher: Society for Industrial and Applied Mathematics3849.
Bartel, Andreas; Günther, Michael
PDAEs in refined electrical network modeling
SIAM Review, 60 (1) :56–91
2018
Publisher: Society for Industrial and Applied Mathematics3848.
Bartel, Andreas; Günther, Michael
PDAEs in refined electrical network modeling
SIAM Review, 60 (1) :56–91
2018
Publisher: Society for Industrial and Applied Mathematics3847.
B{\'a}tkai, Andr{\'a}s; Jacob, Birgit; Voigt, Jürgen; Wintermayr, Jens
Perturbations of positive semigroups on {AM}-spaces
Semigroup Forum, 96 (2) :333--347
20183846.
Bátkai, András; Jacob, Birgit; Voigt, Jürgen; Wintermayr, Jens
Perturbations of positive semigroups on AM-spaces
Semigroup Forum, 96 (2) :333--347
20183845.
[english] Bohrmann-Linde, Claudia; Zeller, Diana
Photosensitizers for Photogalvanic Cells in the Chemistry Classroom
World Journal of Chemical Education, 6 (1) :36--42
2018
Publisher: Science and Education Publishing Co., Ltd.3844.
[english] Tausch, Michael W.
Phototactive Thin Films in Science Education
World Journal of Chemical Education, 6 (1) :14--17
2018
Publisher: Science and Education Publishing Co., Ltd.3843.
Bargetz, Christian; Wegner, Sven-Ake
Pivot duality of universal interpolation and extrapolation spaces
J. Math. Anal. Appl., 460 (1) :321--331
2018