Applied and Computational Mathematics (ACM)

Model Order Reduction

Model Order Reduction (MOR) is the art of reducing a system's complexity while preserving its input-output behavior as much as possible.

Processes in all fields of todays technological world, like physics, chemistry and electronics, but also in finance, are very often described by dynamical systems. With the help of these dynamical systems, computer simulations, i.e. virtual experiments, are carried out. In this way, new products can be designed without having to build costly prototyps.

Due to the demand of more and more realistic simulations, the dynamical systems, i.e., the mathematical models, have to reflect more and more details of the real world problem. By this, the models' dimensions are increasing and simulations can often be carried out at high computational cost only.

In the design process, however, results are needed quickly. In circuit design, e.g., structures may need to be changed or parameters may need to be altered, in order to satisfy design rules or meet the prescribed performance. One cannot afford idle time, waiting for long simulation runs to be ready.

Model Order Reduction allows to speed up simulations in cases where one is not interested in all details of a system but merely in its input-output behavior. That means, considering a system, one may ask:

  • How do varying parameters influence certain performances ?
    Using the example of circuit design: How do widths and lengths of transistor channels, e.g., influence the voltage gain of a circuit.
  • Is a system stable?
    Using the example of circuit design: In which frequency range, e.g., of voltage sources, does the circuit perform as expected
  • How do coupled subproblems interact?
    Using the example of circuit design: How are signals applied at input-terminals translated to output-pins?

Classical situations in circuit design, where one does not need to know internals of blocks are optimization of design parameters (widths, lengths, ...) and post layout simulations and full system verifications. In the latter two cases, systems of coupled models are considered. In post layout simulations one has to deal with artificial, parasitic circuits, describing wiring effects.

Model Order Reduction automatically captures the essential features of a structure, omitting information which are not decisive for the answer to the above questions. Model Order reduction replaces in this way a dynamical system with another dynamical system producing (almost) the same output, given the same input with less internal states.

MOR replaces high dimensional (e.g. millions of degrees of freedom) with low dimensional (e.g. a hundred of degrees of freedom ) problems, that are then used instead in the numerical simulation.

The working group "Applied Mathematics/Numerical Analysis" has gathered expertise in MOR, especially in circuit design. Within the EU-Marie Curie Initial Training Network COMSON, attention was concentrated on MOR for Differential Algebraic Equations. Members that have been working on MOR in the EU-Marie Curie Transfer of Knowledge project O-MOORE-NICE! gathered knowledge especially in the still immature field of MOR for nonlinear problems.

Current research topics include:

  • MOR for nonlinear, parameterized problems
  • structure preserving MOR
  • MOR for Differential Algebraic Equations
  • MOR in financial applications, i.e., option prizing

Group members working on that field

  • Jan ter Maten
  • Roland Pulch

Publications



2010

2103.

Singh, Poonam; Sharma, Monika; Verma, Udai Pratap; Jensen, Per
Pressure effects on energy gaps and phase transitions in ZnAl\(_{2}\)Se\(_{4}\)
, Zeitschrift fVolume225, Page 508-513
Publisher: Oldenbourg Wissenschaftsverlag GmbH
2010

2102.

Singh, Poonam; Sharma, Monika; Verma, Udai Pratap; Jensen, Per
Pressure effects on energy gaps and phase transitions in ZnAl\(_{2}\)Se\(_{4}\)
, Zeitschrift fVolume225, Page 508-513
Publisher: Oldenbourg Wissenschaftsverlag GmbH
2010

2101.

Singh, Poonam; Sharma, Monika; Verma, Udai Pratap; Jensen, Per
Pressure effects on energy gaps and phase transitions in ZnAl2Se4
, Zeitschrift fVolume225, Page 508-513
Publisher: Oldenbourg Wissenschaftsverlag GmbH
2010

2100.

Verhoeven, A.; Striebel, M.; Rommes, J.; Maten, E. J. W.; Bechtold, T.
Proper Orthogonal Decomposition Model Order Reduction of Nonlinear {IC} Models
In A. D. Fitt and J. Norbury and H. Ockendon and E. Wilson, Editor, Progress in Industrial Mathematics at {ECMI} 2008 Volume 15 from Mathematics in Industry
Page 441--446
Publisher: Springer Berlin Heidelberg
2010
441--446

2099.

Schütze, Nicole; Zhong, Xiaoyin; Kirschbaum, Stefan; Bejan, Iustinian; Benter, Thorsten
Relative kinetic measurements of rate coefficients for the gas-phase reactions of Cl atoms and OH radicals with a series of methyl alkyl esters
Atmospheric Environment, 44 (40) :5407-5414
2010
Publisher: Pergamon

2098.

Sch{ü}tze, Nicole; Zhong, Xiaoyin; Kirschbaum, Stefan; Bejan, Iustinian; Benter, Thorsten
Relative kinetic measurements of rate coefficients for the gas-phase reactions of Cl atoms and OH radicals with a series of methyl alkyl esters
Atmospheric Environment, 44 (40) :5407-5414
2010
Publisher: Pergamon

2097.

Sch{ü}tze, Nicole; Zhong, Xiaoyin; Kirschbaum, Stefan; Bejan, Iustinian; Benter, Thorsten
Relative kinetic measurements of rate coefficients for the gas-phase reactions of Cl atoms and OH radicals with a series of methyl alkyl esters
Atmospheric Environment, 44 (40) :5407-5414
2010
Publisher: Pergamon

2096.

Wyss, Christian
Riesz bases for p-subordinate perturbations of normal operators
J. Funct. Anal., 258 (1) :208-240
2010

2095.

Buckwar, E.; Rößler, R.; Winkler, R.
Runge-Kutta Methods for {SDEs} with Small Noise
SIAM J. Sci. Comp., 32 (4) :1789-1808
2010

2094.

Kirsch, Stefan; Harschneck, Tobias
Schnell zu Biarylen: Direkte Arylierung mit Arylhalogeniden
Nachrichten aus der Chemie, 58 (5) :544–547
2010
ISSN: 1868-0054

2093.

Elshorbany, Yasin F.; Kleffmann, Jörg; Kurtenbach, Ralf; Lissi, Eduardo; Rubio, Mar{í}a A.; Villena, Guillermo; Gramsch, E.; Rickard, A. R.; Pilling, M. J.; Wiesen, Peter
Seasonal dependence of the oxidation capacity of the city of Santiago de Chile
Atmospheric Environment, 44 (40) :5383-5394
2010
Publisher: Pergamon

2092.

Elshorbany, Yasin F.; Kleffmann, Jörg; Kurtenbach, Ralf; Lissi, Eduardo; Rubio, Mar{í}a A.; Villena, Guillermo; Gramsch, E.; Rickard, A. R.; Pilling, M. J.; Wiesen, Peter
Seasonal dependence of the oxidation capacity of the city of Santiago de Chile
Atmospheric Environment, 44 (40) :5383-5394
2010
Publisher: Pergamon

2091.

Elshorbany, Yasin F.; Kleffmann, Jörg; Kurtenbach, Ralf; Lissi, Eduardo; Rubio, María A.; Villena, Guillermo; Gramsch, E.; Rickard, A. R.; Pilling, M. J.; Wiesen, Peter
Seasonal dependence of the oxidation capacity of the city of Santiago de Chile
Atmospheric Environment, 44 (40) :5383-5394
2010
Publisher: Pergamon

2090.

Langer, Nicolle; Schildknecht, Christian; Watanabe, Soichi; Fuchs, Evelyn; Wagenblast, Gerhard; Lennartz, Christian; Molt, Oliver; Dormann, Korinna; Loh, Chuanjie; Hunze, Arvid; Krause, Ralf; Schmid, Günter; Heuser, Karsten; Elsbergen, Van; Boerner, Herbert; Kirsch, Stefan
Silyl- und Heteroatom-substituierte Verbindungen ausgewählt aus Carbazolen, Dibenzofuranen, Dibenzothiophenen und Dibenzophospholen und ihre Anwendung in der organischen Elektronik
2010

2089.

Römisch, W.; Sickenberger, T.; Winkler, R.
Simultaneous step-size and path control for efficient transient noise analysis
In Roos, J. and Costa, L.R., Editor, Scientific Computing in Electrical Engineering SCEE 2008fromMathematics in Industry, Page 167–174
In Roos, J. and Costa, L.R., Editor
Publisher: Springer Berlin Heidelberg
2010

2088.

Römisch, W.; Sickenberger, T.; Winkler, R.
Simultaneous step-size and path control for efficient transient noise analysis
In Roos, J. and Costa, L.R., Editor, Scientific Computing in Electrical Engineering at SCEE 2008, Helsinki, Page 167-174
In Roos, J. and Costa, L.R., Editor
Publisher: Springer, Berlin
2010

2087.

Elshorbany, Yasin F.; Barnes, Ian; Becker, Karl Heinz; Kleffmann, Jörg; Wiesen, Peter
Sources and cycling of tropospheric hydroxyl radicals - An overview
Zeitschrift für Physikalische Chemie, 224 (7-8) :967-987
2010

2086.

Elshorbany, Yasin F.; Barnes, Ian; Becker, Karl Heinz; Kleffmann, Jörg; Wiesen, Peter
Sources and cycling of tropospheric hydroxyl radicals - An overview
Zeitschrift für Physikalische Chemie, 224 (7-8) :967-987
2010

2085.

Elshorbany, Yasin F.; Barnes, Ian; Becker, Karl Heinz; Kleffmann, Jörg; Wiesen, Peter
Sources and cycling of tropospheric hydroxyl radicals - An overview
Zeitschrift für Physikalische Chemie, 224 (7-8) :967-987
2010

2084.

Buckwar, Evelyn; Rößler, Andreas; Winkler, Renate
Stochastic Runge–Kutta methods for Itô SODEs with small noise
SIAM Journal on Scientific Computing, 32 (4) :1789–1808
2010
Publisher: Society for Industrial and Applied Mathematics

2083.

Heilmann, Margareta; Wagner, M.
Strong converse results for Bernstein-Durrmeyer operators and their quasi-interpolants
General Mathematics, 18 (1) :45-53
2010

2082.

Günther, Michael; Schuster, Johann; Siegle, Markus
Symbolic calculation of k-shortest paths and related measures with the stochastic process algebra tool CASPA
Proceedings of the First Workshop on DYnamic Aspects in DEpendability Models for Fault-Tolerant SystemsfromDYADEM-FTS '10, Page 13–18
Publisher: Association for Computing Machinery
2010

2081.

Günther, Michael; Schuster, Johann; Siegle, Markus
Symbolic calculation of k-shortest paths and related measures with the stochastic process algebra tool CASPA
Proceedings of the First Workshop on DYnamic Aspects in DEpendability Models for Fault-Tolerant SystemsfromDYADEM-FTS '10, Page 13–18
Publisher: Association for Computing Machinery
2010

2080.

Kienitz, Jörg
Tempered Stable Process
Publisher: John Wiley & Sons
2010

2079.

Verhoeven, A.; Maten, E. J. W.; Dohmen, J. J.; Tasi{\'{c}}, B.; Mattheij, R. M. M.
Terminal Current Interpolation for Multirate Time Integration of Hierarchical {IC} Models
In A. D. Fitt and J. Norbury and H. Ockendon and E. Wilson, Editor, Progress in Industrial Mathematics at {ECMI} 2008 Volume 15 from Mathematics in Industry
Page 333--339
Publisher: Springer Berlin Heidelberg
2010
333--339