Thermal Coupling
The performance of high-tech circuitry such as processors and power devices also largely depends on the thermal level. Semiconductor devices loss their ability of fast switching if the temperature increases to much. Furthermore after a critical temperature is reached the device will be destroyed. Therefore monitoring temperature and regulating cooling are important issues.
In our research, we set up simulation models for semiconductor equations and integrated circuits, which incorporate transient temperature changes in the device and heat conduction between devices. That is an electric network as well as semiconductor equations have to be equipped with an appropriate model for power transfer and heat conduction.
Since this multiphysical problem of coupled electric networks and heat conduction exhibits widely separated time scales, not only the model but also the numerical algorithms need be design to enable fast simulations. Multirate cosimulation is an good choice if the coupling is appropriately set up. Please see also: (Coupled DAEs).
Publications
- 1999
834.
Jensen, Per; Bunker, Philip R.
Nuclear spin statistical weights revisited
Molecular Physics, 97 (6) :821-824
1999833.
Jensen, Per; Bunker, Philip R.
Nuclear spin statistical weights revisited
Molecular Physics, 97 (6) :821-824
1999832.
Jensen, Per; Bunker, Philip R.
Nuclear spin statistical weights revisited
Molecular Physics, 97 (6) :821-824
1999831.
Gilg, A.; Günther, M.
Numerical Circuit Simulation
Survey on Mathematics for Industry, 8 :165–169
1999
Herausgeber: Springer Verlag830.
Gilg, A
Numerical circuit simulation
SURVEYS ON MATHEMATICS FOR INDUSTRY, 8 :165--169
1999
Herausgeber: SPRINGER-VERLAG829.
Maten, E. J. W.
Numerical methods for frequency domain analysis of electronic circuits
Surveys on Mathematics for Industry, 8 :171-185
1999828.
Günther, Michael; Hoschek, M.
Partitioning strategies in circuit simulation
In Bungartz, Hans-Joachim and Durst, Franz and Zenger, Christoph, Editor, High Performance Scientific and Engineering ComputingBand8ausLecture Notes in Computational Science and Engineering, Seite 343–352
In Bungartz, Hans-Joachim and Durst, Franz and Zenger, Christoph, Editor
Herausgeber: Springer Berlin Heidelberg
1999827.
Günther, Michael; Hoschek, Markus
Partitioning strategies in circuit simulation
In H.-J. Bungartz and F. Durst and Chr. Zenger, Editor, High Performance Scientific and Engineering Computing: Proceedings of the International FORTWIHR Conference on HPSEC, Munich, March 16-18, 1998Band8ausLecture Notes in Computational Science and Engineering, Seite 343--352
Springer Berlin Heidelberg
In H.-J. Bungartz and F. Durst and Chr. Zenger, Editor
Herausgeber: Springer Verlag
1999826.
Günther, M.; Rentrop, P.
PDAE-Netzwerkmodelle in der elektrischen Schaltungssimulation
In John, W., Editor, Analog '99 : 5. ITG/GMM-Diskussionssitzung Entwicklung von Analogschaltungen mit CAE-Methoden mit dem Schwerpunkt Entwurfsmethodik und parasitäre Effekte, Seite 31–38
In John, W., Editor
Herausgeber: FhG IZM - Advanced System Engineering Paderborn
1999825.
Günther, Michael; Rentrop, Peter
PDAE-Netzwerkmodelle in der elektrischen Schaltungssimulation [PDAE networkmodels in electric switching simulation]
1999824.
Langer, U; Rienen, U van
Resume of the collection of articles on scientific computing in electrical engineering
Surveys on Mathematics for Industry, 9 (2) :151--154
1999
Herausgeber: Wien; New York: Springer-Verlag, 1991-c2005.823.
Kevenaar, T.A.M.; Maten, E.J.W.
RF IC simulation: state-of-the-art and future trends
International Conference on Simulation of Semiconductor Processes and Devices. {SISPAD}{\textquotesingle}99 ({IEEE} Cat. No.99TH8387), Seite 7-10
Herausgeber: Japan Soc. Appl. Phys
1999822.
Günther, M.; Hoschek, M.
ROW-type integration methods for circuit simulation packages
In Arkeryd, Leif and Berg, Jöran and Brenner, Philip and Pettersson, Rolf, Editor
Seite 448–455
Herausgeber: B.G. Teubner, Stuttgart
1999
448–455821.
Fateev, A. A.; Fink, Ewald H.; Pravilov, A. M.
Simple method of spectrometer/detector sensitivity calibrations in the 210-1150 nm range
Measurement Science and Technology, 10 (3) :182-189
1999820.
Fateev, A. A.; Fink, Ewald H.; Pravilov, A. M.
Simple method of spectrometer/detector sensitivity calibrations in the 210-1150 nm range
Measurement Science and Technology, 10 (3) :182-189
1999819.
Fateev, A. A.; Fink, Ewald H.; Pravilov, A. M.
Simple method of spectrometer/detector sensitivity calibrations in the 210-1150 nm range
Measurement Science and Technology, 10 (3) :182-189
1999818.
Feldmann, U.; Günther, M.
Some remarks on regularization of circuit equations
In Mathis, W. and Schindler, T., Editor, Proceedings of the X International Symposium on Theoretical Electrical Engineering (ISTET '99), Seite 343–348
In Mathis, W. and Schindler, T., Editor
Herausgeber: Otto-von-Guericke-University Magdeburg
1999817.
Feldmann, Uwe; Günther, Michael
Some remarks on regularization of circuit equations
In W. Mathis, Editor aus Conference Proceedings
Herausgeber: Universität Karlsruhe, Institut für Wissenschaftliches Rechnen und~…
1999816.
Bunker, Philip R.; Jensen, Per
Spherical top molecules and the molecular symmetry group
Molecular Physics, 97 (1-2) :255-264
1999815.
Bunker, Philip R.; Jensen, Per
Spherical top molecules and the molecular symmetry group
Molecular Physics, 97 (1-2) :255-264
1999814.
Bunker, Philip R.; Jensen, Per
Spherical top molecules and the molecular symmetry group
Molecular Physics, 97 (1-2) :255-264
1999813.
Foster, Krishna L.; Caldwell, Tracy E.; Benter, Thorsten; Langer, Sarka; Hemminger, John C.; Finlayson-Pitts, Barbara J.
Techniques for quantifying gaseous HOCl using atmospheric pressure ionization mass spectrometry
Physical Chemistry Chemical Physics, 1 (24) :5615-5621
1999812.
Foster, Krishna L.; Caldwell, Tracy E.; Benter, Thorsten; Langer, Sarka; Hemminger, John C.; Finlayson-Pitts, Barbara J.
Techniques for quantifying gaseous HOCl using atmospheric pressure ionization mass spectrometry
Physical Chemistry Chemical Physics, 1 (24) :5615-5621
1999811.
Foster, Krishna L.; Caldwell, Tracy E.; Benter, Thorsten; Langer, Sarka; Hemminger, John C.; Finlayson-Pitts, Barbara J.
Techniques for quantifying gaseous HOCl using atmospheric pressure ionization mass spectrometry
Physical Chemistry Chemical Physics, 1 (24) :5615-5621
1999810.
Beutel, M.; Setzer, Klaus-Dieter; Fink, Ewald H.
The b\(^{1}\)\(\Sigma\)\(^{+}\)(b0\(^{+}\)) → X\(^{3}\)\(\Sigma\)\(^{-}\)(X\(_{1}\)0\(^{+}\), X\(_{2}\)1) and a\(^{1}\)\(\Delta\)(a2) → X\(_{2}\)1 Transitions of AsI
Journal of Molecular Spectroscopy, 194 (2) :250-255
1999
Herausgeber: Academic Press